Study of Carbon Nanotube Based Devices Using Scanning Probe Microscope
نویسندگان
چکیده
منابع مشابه
Scanning Probe Techniques for Engineering Nanoelectronic Devices
microscopy-based techniques is enabling new ways to build and investigate nanoscale electronic devices. Here we review several advanced techniques to characterize and manipulate nanoelectronic devices using an atomic force microscope (AFM). Starting from a carbon nanotube (CNT) network device that is fabricated by conventional photolithography (micron-scale resolution) individual carbon nanotub...
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